Devices for testing of semiconductor devices and microcircuitry parameters.

• Л2-54
• Л2-60

LOW-POWER TRANSISTOR-AND-DIODE TESTER Л2-54

This tester is intended for assessing the performance of low-power transistors and low- and medium-power diodes by measuring their basic parameters in the development, operation and repair of the electronic equipment.

DIGITAL INTEGRATED CIRCUIT TESTER Л2-60

The tester is intended for assessing trie performance of iogical integrated circuits with as many as 16 pins in the K151.15-3, K151.14-1, K23S.16-1, K239.14, K401.14-1, K402.16-1, "Posol" packages by checking them (or the performance of logical function during the development, operation, testing and repair of the electronic equipment under field, production test and laboratory conditions.

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