Devices for testing of semiconductor devices and microcircuitry parameters.
DIGITAL INTEGRATED CIRCUIT TESTER Л2-60
The description.
The tester is intended for assessing the performance of logical integrated circuits with as many as 16 pins in the K151.15-3, K151.14-1, K23S.16-1, K239.14, K401.14-1, K402.16-1, "Posol" packages by checking them (or the performance of logical function during the development, operation, testing and repair of the electronic equipment under field, production test and laboratory conditions.
| SPECIFICATIONS: |
| DC voltage measurement range, V |
0,1-30 |
| Direct current measurement range, mA |
0,03-3 |
| DC voltage and current basic measurement error, % |
±4 |
| DC voltage and current complementary measurement error in ambient temperature
range from 278 to 313 K (5 to 40 °C) from the end value of the practical range of scale
in set-up subrange, %, max. |
8 |
| Power source E1 voltage setting range, V |
±(3-30) |
| Power source E2 voltage setting range, V |
±(1-15) |
| Logic zero voltage (U°) setting range, V |
±(0,2-3) |
| Logic one voltage setting range (U1), V |
±(U°-10) |
| AC power supply, V,Hz |
220/50 |
| Power consumption, VA, max |
20 |
| Mean-time-between-failures, hours |
25000 |
| Dimensions, mm |
302x205x175 |
| Weight, kg, max |
5 |
| Ambient temperature range, °C |
from 5 up to 40 |
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Copyright © 2003 РУП "Минский завод Калибр"
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